IeeeCC754 tests the correct implementation of the ieee floating point constant evaluation. Call make; make test to run the test. Or do the test by hand: How to call the driver program IeeeCC754 ======================================== Summary: IeeeCC754 -c {-s|-d|-l|-q|-m|{-e -t [-h]}} -r {n|p|m|z} -i -n {i|o|x|z|u|tiny|nan|inf|snz} -f logfile testfile IeeeCC754 -u -r {n|p|m|z} -i -n {i|o|x|z|u|tiny|nan|inf|snz} -f logfile testfile IeeeCC754 -o {-s|-d|-l|-q|-m|{-e -t [-h]}} -r {n|p|m|z} -i -n {i|o|x|z|u|tiny|nan|inf|snz} -f logfile testfile The required argument 'testfile' is a file of test vectors in extended Coonen syntax (the default) or SUN-UCB format. The options of the driver program can be subdivided in three categories, listed below. (1) Options to specify the purpose of the run. Use precisely one of the following three options: -c : perform testing: file of test vectors is in Coonen syntax -u : perform testing: file of test vectors is in SUN-UCB format -o : do not perform testing but only translate testdata from Coonen syntax to hexadecimal SUN-UCB format and output to (2) Options to specify the precision and exponent range of the source (and for some conversions also the destination) floating-point format, when the file of test vectors is in extended Coonen syntax. When the file of test vectors is in SUN-UCB format, the precision and exponent range are specified in the testfile itself, and the options below should be skipped. -s : single precision (same as -e 8 -t 24 -h) -d : double precision (same as -e 11 -t 53 -h) -l : long double precision (same as -e 15 -t 64) -q : quadruple precision (same as -e 15 -t 113 -h) -m : 240 bit multiprecision (same as -e 15 -t 240) -e : provide bits to represent exponent -t : provide bits precision -h : leading bit is hidden -ds : single precision destination -dd : double precision destination -dl : long double precision destination -dq : quadruple precision destination -dm : 240 bit multiprecision destination -de : size of destination exponent -dt : destination precision -dh : leading bit is hidden in destination (3) Options to influence the actual testing phase (optional) -r {n|p|m|z}: test only the specified rounding modes -n {i|o|x|z|u|tiny|nan|inf|snz}: do not test the specified exceptions, denormalized numbers, NaNs, signed infinities or signed zeroes -j {o|u|i|z}: jump/skip test vectors raising the overflow, underflow, invalid or divide by zero exception -ieee: test conversions only within range specified by IEEE -i: idem as -ieee -f logfile: output log of testing to 'logfile'; the default value for 'logfile' is ieee.log